Patent Assignment
Reel/Frame 028631/0075
Assignment of Assignor's Interest
Recorded: 2012-07-25
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Device and Method of Inspecting Defect
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.