IP Library › Assignment 028669/0074
Patent Assignment
Reel/Frame 028669/0074

Assignment of Assignor's Interest

Recorded: 2012-07-30 Pages: 2
Assignors
SHIBATA, YUKIHIRO
Executed: 2012-07-23
HONDA, TOSHIFUMI
Executed: 2012-07-23
UENO, TAKETO
Executed: 2012-07-23
TANIGUCHI, ATSUSHI
Executed: 2012-07-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Device Thereof
Patent: 9,255,793 →
Application: 13/521,086 →
Publication: US 2012/0296576
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →