Patent Assignment
Reel/Frame 028741/0885
Assignment of Assignor's Interest
Recorded: 2012-08-07
Pages: 2
Assignor
SHIMURA, KEI
Executed: 2012-06-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Inspecting Device and Defect Inspecting Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.