IP Library › Assignment 028742/0462
Patent Assignment
Reel/Frame 028742/0462

Assignment of Assignor's Interest

Recorded: 2012-08-07 Pages: 2
Assignors
MORIKAWA, AKINARI
Executed: 2012-06-04
SATO, TAKESHI
Executed: 2012-06-04
NAKAZAWA, EIKO
Executed: 2012-06-08
KUWABATA, SUSUMU
Executed: 2012-06-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device and Sample Observation Method
Patent: 8,546,770 →
Application: 13/515,717 →
Publication: US 2012/0292507
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →