IP Library › Assignment 028824/0304
Patent Assignment
Reel/Frame 028824/0304

Change of Name

Recorded: 2012-08-21 Pages: 6
Assignor
VEECO METROLOGY, INC.
Executed: 2010-10-07
Assignee
BRUKER NANO, INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Property (1)
Large-Surface Defect Detection by Single-Frame Spatial-Carrier Interferometry
Patent: 8,275,573 →
Application: 12/624,284 →
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 23, 2009
From: SCHMIT, JOANNA; MUNTEANU, FLORIN
To: VEECO INSTRUMENTS, INC.
Reel/Frame 023560/0324 →
Assignment of Assignor's Interest Sep 28, 2010
From: VEECO INSTRUMENTS INC.
To: VEECO METROLOGY INC.
Reel/Frame 025051/0290 →