IP Library Assignment 029091/0916
Patent Assignment
Reel/Frame 029091/0916

Assignment of Assignor's Interest

Recorded: 2012-10-08 Pages: 3
Assignors
TAKADA, SATOSHI
Executed: 2012-09-24
SUZUKI, NAOMASA
Executed: 2012-09-24
BAN, NAOMA
Executed: 2012-09-24
KATO, TATSUICHI
Executed: 2012-09-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scanning Electron Microscope and Sample Observation Method
Patent: 8,519,334 →
Application: 13/639,999 →
Publication: US 2013/0037716
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →