IP Library Assignment 029159/0405
Patent Assignment
Reel/Frame 029159/0405

Assignment of Assignor's Interest

Recorded: 2012-10-19 Pages: 5
Assignors
SCHONLEBER, MARTIN, DR.
Executed: 2012-10-09
MICHELT, BERTHOLD
Executed: 2012-10-09
Assignee
PRECITEC OPTRONIK GMBH
SCHLEUSSNERSTRASSE 54, NEU-ISENBURG, 63263, GERMANY
Covered Property (1)
Test Device for Testing a Bonding Layer Between Wafer-Shaped Samples and Test Process for Testing the Bonding Layer
Patent: 9,494,409 →
Application: 13/525,184 →
Publication: US 2012/0320380