IP Library › Assignment 029356/0165
Patent Assignment
Reel/Frame 029356/0165

Assignment of Assignor's Interest

Recorded: 2012-11-27 Pages: 2
Assignors
TAKAGI, YUJI
Executed: 2012-06-25
HARADA, MINORU
Executed: 2012-06-25
NAKAGAKI, RYO
Executed: 2012-06-26
HOSOYA, NAOKI
Executed: 2012-06-28
HONDA, TOSHIFUMI
Executed: 2012-06-26
HIRAI, TAKEHIRO
Executed: 2012-06-26
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Device for Testing Defect Using Sem
Patent: 9,390,490 →
Application: 13/520,210 →
Publication: US 2013/0070078
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →