Patent Assignment
Reel/Frame 029454/0006
Assignment of Assignor's Interest
Recorded: 2012-12-12
Pages: 4
Assignor
SUGAWARA, HIROSHI
Executed: 2012-12-05
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Fabrication and Testing Method for Nonvolatile Memory Devices