IP Library › Assignment 029594/0329
Patent Assignment
Reel/Frame 029594/0329

Assignment of Assignor's Interest

Recorded: 2013-01-09 Pages: 4
Assignors
LAGOWSKI, JACEK
Executed: 2012-08-31
WILSON, MARSHALL D.
Executed: 2012-08-31
Assignee
SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
PRIELLE KORNELIA STR. 2, BUDAPEST, H-1117, HUNGARY
Covered Property (1)
Accurate Measurement of Excess Carrier Lifetime Using Carrier Decay Method
Patent: 8,912,799 →
Application: 13/673,762 →
Publication: US 2013/0169283
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct the Assignee's Name Inside the Assignment Document and on the Cover Sheet Previously Recorded at Reel: 29594 Frame: 329. Assignor(S) Hereby Confirms the Assignment. Nov 14, 2024
From: LAGOWSKI, JACEK; WILSON, MARSHALL D.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 069360/0819 →
Assignment of Assignor's Interest Feb 27, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB SDI
Reel/Frame 070349/0780 →
Assignment of Assignor's Interest Apr 7, 2025
From: SEMILAB SDI
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 070753/0751 →