Patent Assignment
Reel/Frame 070349/0780
Assignment of Assignor's Interest
Recorded: 2025-02-27
Pages: 9
Assignor
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Executed: 2025-01-25
Assignee
SEMILAB SDI
12415 TELECOM DR., TAMPA, FLORIDA, 33637
Covered Properties
(8)
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
PCT:
PCT/US2024/019083 ↗
Non-Contact Method for Acquiring Charge-Voltage Data on Miniature Test Areas of Semiconductor Product Wafers
Accurate Measuring of Long Steady State Minority Carrier Diffusion Lengths
Accurate Measurement of Excess Carrier Lifetime Using Carrier Decay Method
Measuring semiconductor doping using constant surface potential corona charging
Non-Contact Method to Monitor and Quantify Effective Work Function of Metals
Topside Contact Device and Method for Characterization of High Electron Mobility Transistor (Hemt) Heterostructure on Insulating and Semi-Insulating Substrates
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
Patent:
12,027,430 →
Application:
18/123,211 →
Related Assignments
(15)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 19, 2005
From: LAGOWSKI, JACEK; EDELMAN, PIOTR; MARINSKIY, DMITRIY; KOCHEY, JOSEPH NICHOLAS
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 016912/0991 →
Assignment of Assignor's Interest
Oct 1, 2009
From: LAGOWSKI, JACEK; SAVTCHOUK, ALEXANDRE; WILSON, MARSHALL D.
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 023315/0646 →
Assignment of Assignor's Interest
Jan 9, 2013
From: LAGOWSKI, JACEK; WILSON, MARSHALL D.
To: SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 029594/0329 →
Assignment of Assignor's Interest
Dec 14, 2015
From: BUDAY, CSABA
To: SEMILAB SDI LLC
Reel/Frame 037281/0752 →
Assignment of Assignor's Interest
Dec 14, 2015
From: LAGOWSKI, JACEK; WILSON, MARSHALL; SAVTCHOUK, ALEXANDRE; ALMEIDA, CARLOS
To: SEMILAB SDI LLC
Reel/Frame 037281/0677 →
Assignment of Assignor's Interest
May 13, 2016
From: MARINSKIY, DMITRIY; LOY, THYE CHONG; LAGOWSKI, JACEK
To: SEMILAB SDI LLC
Reel/Frame 038580/0442 →
Assignment of Assignor's Interest
May 8, 2017
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 042271/0789 →
Assignment of Assignor's Interest
Dec 4, 2017
From: SEMILAB SDI LLC
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 044285/0025 →
Assignment of Assignor's Interest
Jun 4, 2021
From: WILSON, MARSHALL; SCHRAYER, BRET; SAVTCHOUK, ALEXANDRE; MARINSKIY, DMITRIY
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 056439/0307 →
Assignment of Assignor's Interest
Oct 6, 2023
From: WILSON, MARSHALL D.; LAGOWSKI, JACEK; ALMEIDA, CARLOS; SCHRAYER, BRET
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 065150/0001 →
Corrective Assignment to Correct the Assignee's Name Inside the Assignment Document and on the Cover Sheet Previously Recorded at Reel: 29594 Frame: 329. Assignor(S) Hereby Confirms the Assignment.
Nov 14, 2024
From: LAGOWSKI, JACEK; WILSON, MARSHALL D.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 069360/0819 →
Assignment of Assignor's Interest
Apr 7, 2025
From: SEMILAB SDI
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 070753/0751 →
Assignment of Assignor's Interest
Apr 8, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 070769/0144 →
Patent Assignment Agreement
Oct 20, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 073165/0319 →
Assignment of Assignor's Interest
Nov 13, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB USA, LLC
Reel/Frame 072891/0915 →