Patent Assignment
Reel/Frame 073165/0319
Patent Assignment Agreement
Recorded: 2025-10-20
Pages: 4
Assignor
SEMICONDUCTOR DIAGNOSTICS, INC.
Executed: 2025-07-30
Assignee
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
PRIELLE KORNELIA U. 2, BUDAPEST, H-1117, HUNGARY
Covered Properties
(2)
Non-Contact Method for Acquiring Charge-Voltage Data on Miniature Test Areas of Semiconductor Product Wafers
Accurate Measuring of Long Steady State Minority Carrier Diffusion Lengths
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 19, 2005
From: LAGOWSKI, JACEK; EDELMAN, PIOTR; MARINSKIY, DMITRIY; KOCHEY, JOSEPH NICHOLAS
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 016912/0991 →
Assignment of Assignor's Interest
Oct 1, 2009
From: LAGOWSKI, JACEK; SAVTCHOUK, ALEXANDRE; WILSON, MARSHALL D.
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 023315/0646 →
Assignment of Assignor's Interest
May 8, 2017
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 042271/0789 →
Assignment of Assignor's Interest
Feb 27, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB SDI
Reel/Frame 070349/0780 →
Assignment of Assignor's Interest
Apr 8, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 070769/0144 →
Assignment of Assignor's Interest
Nov 13, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB USA, LLC
Reel/Frame 072891/0915 →