Patent Assignment
Reel/Frame 016912/0991
Assignment of Assignor's Interest
Recorded: 2005-10-19
Pages: 7
Assignors
LAGOWSKI, JACEK
Executed: 2005-08-29
EDELMAN, PIOTR
Executed: 2005-08-29
MARINSKIY, DMITRIY
Executed: 2005-08-29
KOCHEY, JOSEPH NICHOLAS
Executed: 2005-08-29
ALMEIDA, CARLOS
Executed: 2005-08-29
Assignee
SEMICONDUCTOR DIAGNOSTICS, INC.
3650 SPECTRUM BOULEVARD, SUITE 130, TAMPA, FLORIDA, 33612-9401
Covered Property
(1)
Non-Contact Method for Acquiring Charge-Voltage Data on Miniature Test Areas of Semiconductor Product Wafers
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
May 8, 2017
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 042271/0789 →
Assignment of Assignor's Interest
Feb 27, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB SDI
Reel/Frame 070349/0780 →
Patent Assignment Agreement
Oct 20, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 073165/0319 →
Assignment of Assignor's Interest
Nov 13, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB USA, LLC
Reel/Frame 072891/0915 →