IP Library › Assignment 072891/0915
Patent Assignment
Reel/Frame 072891/0915

Assignment of Assignor's Interest

Recorded: 2025-11-13 Pages: 18
Assignor
Assignee
SEMILAB USA, LLC
12415 TELECOM DR., TAMPA, FLORIDA, 33637
Covered Properties (8)
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
Non-Contact Method for Acquiring Charge-Voltage Data on Miniature Test Areas of Semiconductor Product Wafers
Patent: 7,202,691 →
Application: 11/191,093 →
Publication: US 2006/0267622
Accurate Measuring of Long Steady State Minority Carrier Diffusion Lengths
Patent: 8,093,920 →
Application: 12/545,345 →
Publication: US 2010/0085073
Measuring semiconductor doping using constant surface potential corona charging
Application: 14/731,677 →
Publication: US 2016/0356750
Non-Contact Method to Monitor and Quantify Effective Work Function of Metals
Application: 15/055,062 →
Publication: US 2016/0252565
Topside Contact Device and Method for Characterization of High Electron Mobility Transistor (Hemt) Heterostructure on Insulating and Semi-Insulating Substrates
Application: 17/332,952 →
Publication: US 2022/0381816
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
Application: 18/123,211 →
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
Application: 18/751,116 →
Publication: US 2024/0347399
Related Assignments (13)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 19, 2005
From: LAGOWSKI, JACEK; EDELMAN, PIOTR; MARINSKIY, DMITRIY; KOCHEY, JOSEPH NICHOLAS
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 016912/0991 →
Assignment of Assignor's Interest Oct 1, 2009
From: LAGOWSKI, JACEK; SAVTCHOUK, ALEXANDRE; WILSON, MARSHALL D.
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 023315/0646 →
Assignment of Assignor's Interest Dec 14, 2015
From: BUDAY, CSABA
To: SEMILAB SDI LLC
Reel/Frame 037281/0752 →
Assignment of Assignor's Interest Dec 14, 2015
From: LAGOWSKI, JACEK; WILSON, MARSHALL; SAVTCHOUK, ALEXANDRE; ALMEIDA, CARLOS
To: SEMILAB SDI LLC
Reel/Frame 037281/0677 →
Assignment of Assignor's Interest May 13, 2016
From: MARINSKIY, DMITRIY; LOY, THYE CHONG; LAGOWSKI, JACEK
To: SEMILAB SDI LLC
Reel/Frame 038580/0442 →
Assignment of Assignor's Interest May 8, 2017
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 042271/0789 →
Assignment of Assignor's Interest Dec 4, 2017
From: SEMILAB SDI LLC
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 044285/0025 →
Assignment of Assignor's Interest Jun 4, 2021
From: WILSON, MARSHALL; SCHRAYER, BRET; SAVTCHOUK, ALEXANDRE; MARINSKIY, DMITRIY
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 056439/0307 →
Assignment of Assignor's Interest Oct 6, 2023
From: WILSON, MARSHALL D.; LAGOWSKI, JACEK; ALMEIDA, CARLOS; SCHRAYER, BRET
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 065150/0001 →
Assignment of Assignor's Interest Jun 21, 2024
From: WILSON, MARSHALL D.; LAGOWSKI, JACEK; ALMEIDA, CARLOS; SCHRAYER, BRET
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 067806/0184 →
Assignment of Assignor's Interest Feb 27, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB SDI
Reel/Frame 070349/0780 →
Assignment of Assignor's Interest Apr 8, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 070769/0144 →
Patent Assignment Agreement Oct 20, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 073165/0319 →