Patent Assignment
Reel/Frame 042271/0789
Assignment of Assignor's Interest
Recorded: 2017-05-08
Pages: 6
Assignor
SEMICONDUCTOR DIAGNOSTICS, INC.
Executed: 2017-04-20
Assignee
SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
PRIELLE KORNELIA U. 2, BUDAPEST, H-1117, HUNGARY
Covered Properties
(3)
Method for Fast and Accurate Determination of the Minority Carrier Diffusion Length from Simultaneously Measured Surface Photovoltages
Patent:
6,512,384 →
Application:
09/672,351 →
Steady State Method for Measuring the Thickness and the Capacitance of Ultra Thin Dielectric in the Presence of Substantial Leakage Current
Non-Contact Method for Acquiring Charge-Voltage Data on Miniature Test Areas of Semiconductor Product Wafers
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 28, 2000
From: LAGOWSKI, JACEK; FAIFER, VLADIMIR; ALEINIKOV, ANDREI
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 011209/0799 →
Assignment of Assignor's Interest
May 17, 2001
From: LAGOWSKI, JACEK; SAVTCHOUK, ALEXANDER; WILSON, MARSHALL D.
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 011820/0953 →
Assignment of Assignor's Interest
Oct 19, 2005
From: LAGOWSKI, JACEK; EDELMAN, PIOTR; MARINSKIY, DMITRIY; KOCHEY, JOSEPH NICHOLAS
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 016912/0991 →
Assignment of Assignor's Interest
Feb 27, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB SDI
Reel/Frame 070349/0780 →
Patent Assignment Agreement
Oct 20, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 073165/0319 →
Assignment of Assignor's Interest
Nov 13, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB USA, LLC
Reel/Frame 072891/0915 →