Patent Assignment
Reel/Frame 011820/0953
Assignment of Assignor's Interest
Recorded: 2001-05-17
Pages: 5
Assignors
LAGOWSKI, JACEK
Executed: 2001-05-02
SAVTCHOUK, ALEXANDER
Executed: 2001-05-14
WILSON, MARSHALL D.
Executed: 2001-05-03
Assignee
SEMICONDUCTOR DIAGNOSTICS, INC.
SUITE 130, 3650 SPECTRUM BOULEVARD, TAMPA, FLORIDA, 33612
Covered Property
(1)
Steady State Method for Measuring the Thickness and the Capacitance of Ultra Thin Dielectric in the Presence of Substantial Leakage Current
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.