IP Library › Assignment 029669/0569
Patent Assignment
Reel/Frame 029669/0569

Assignment of Assignor's Interest

Recorded: 2013-01-22 Pages: 2
Assignors
MATSUMOTO, SHUNICHI
Executed: 2012-12-28
UENO, TAKETO
Executed: 2013-01-09
TANIGUCHI, ATSUSHI
Executed: 2013-01-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Inspecting Defect
Patent: 9,535,013 →
Application: 13/702,696 →
Publication: US 2013/0114880
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →