IP Library Assignment 029686/0948
Patent Assignment
Reel/Frame 029686/0948

Assignment of Assignor's Interest

Recorded: 2013-01-24 Pages: 2
Assignors
HONDA, TOSHIFUMI
Executed: 2012-12-18
URANO, YUTA
Executed: 2012-12-18
SHIBATA, YUKIHIRO
Executed: 2013-01-07
NAKAO, TOSHIYUKI
Executed: 2012-12-21
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Device Therefor
Patent: 8,711,347 →
Application: 13/701,030 →
Publication: US 2013/0114078
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →