IP Library Assignment 029709/0852
Patent Assignment
Reel/Frame 029709/0852

Assignment of Assignor's Interest

Recorded: 2013-01-29 Pages: 2
Assignors
YAMADA, SHINYA
Executed: 2012-11-28
TAKAGI, YUJI
Executed: 2012-11-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Dimension Measurement Method, Pattern Dimension Measurement Device, Program for Causing Computer to Execute Pattern Dimension Measurement Method, and Recording Medium Having Same Recorded Thereon
Patent: 9,191,628 →
Application: 13/699,167 →
Publication: US 2013/0120551
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →