Change of Name

Recorded: 2013-02-13 Received: 2013-02-13 Pages: 7

Assignor

NANOPHOTONICS AG

Executed: 2010-04-21

Assignee

NANOPHOTONICS GMBH

GALILEO-GALILEI-STR. 28, 55129 MAINZ, DEX, GERMANY

Covered Properties (7)

Inspection Device and Inspection Method for the Optical Examination of Object Surfaces, Particularly of Wafer Surfaces

Application: 12/657,744 →

Holding and Turning Device for Touch-Sensitive Flat Objects

Application: 12/311,371 →

Method and Apparatus for Segmentation and Reassembly of Data Packets in a Communication Switch

Application: 11/269,251 →

Holding Device for Disk-Shaped Objects

Application: 10/913,891 →

Device for Measuring Surface Defects

Application: 10/237,909 →

Measuring Module

Application: 10/120,641 →

Measurement box with module for measuring wafer characteristics

Application: 10/120,639 →