IP Library Assignment 029937/0426
Patent Assignment
Reel/Frame 029937/0426

Assignment of Assignor's Interest

Recorded: 2013-03-07 Pages: 2
Assignors
KAWAGUCHI, HIROSHI
Executed: 2013-02-19
JINGU, TAKAHIRO
Executed: 2013-02-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Photoelectric Conversion Element, Defect Inspecting Apparatus, and Defect Inspecting Method
Patent: 8,884,207 →
Application: 13/821,246 →
Publication: US 2013/0161490
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →