Patent Assignment
Reel/Frame 029948/0152
Assignment of Assignor's Interest
Recorded: 2013-03-08
Pages: 2
Assignors
NAKAO, TOSHIYUKI
Executed: 2012-11-22
XU, JUNGUO
Executed: 2012-11-22
SHIMIZU, YUKI
Executed: 2013-02-11
NAKATA, TOSHIHIKO
Executed: 2012-12-04
HONDA, TOSHIFUMI
Executed: 2013-01-07
SHIBATA, YUKIHIRO
Executed: 2013-01-07
URANO, YUTA
Executed: 2012-11-22
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Device for Inspecting for Defects
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.