IP Library › Assignment 029956/0041
Patent Assignment
Reel/Frame 029956/0041

Assignment of Assignor's Interest

Recorded: 2013-03-08 Pages: 3
Assignors
KUSUNOSE, HARUHIKO
Executed: 2013-02-21
MIYAI, HIROKI
Executed: 2013-02-21
Assignee
LASERTEC CORPORATION
2-10-1 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA, KANAGAWA, 222-8552, JAPAN
Covered Property (1)
Defect Coordinates Measurement Device, Defect Coordinates Measurement Method, Mask Manufacturing Method, and Reference Mask
Patent: 9,638,739 →
Application: 13/791,537 →
Publication: US 2013/0245971