Patent Assignment
Reel/Frame 030004/0483
Assignment of Assignor's Interest
Recorded: 2013-03-14
Pages: 2
Assignors
AKIYAMA, HAJIME
Executed: 2013-01-11
OKADA, AKIRA
Executed: 2013-01-11
YAMASHITA, KINYA
Executed: 2013-01-11
Assignee
MITSUBISHI ELECTRIC CORPORATION
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property
(1)
Semiconductor Testing Jig and Semiconductor Testing Method Performed by Using the Same