IP Library Assignment 030070/0411
Patent Assignment
Reel/Frame 030070/0411

Assignment of Assignor's Interest

Recorded: 2013-03-22 Pages: 4
Assignors
MAN, XIN
Executed: 2013-02-26
UEMOTO, ATSUSHI
Executed: 2013-02-26
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Sample Observation Method, Sample Preparation Method, and Charged Particle Beam Apparatus
Patent: 9,287,087 →
Application: 13/842,274 →
Publication: US 2013/0248707
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →