Patent Assignment
Reel/Frame 072909/0223
Change of Address
Recorded: 2025-09-17
Pages: 12
Assignor
HITACHI HIGH-TECH SCIENCE CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6411, JAPAN
Covered Properties
(50)
Composite charged particle beam apparatus and sample processing and observing method
Sample Processing and Observing Method
Thermal analyzer
Charged Particle Beam Apparatus and Sample Processing Method
X-Ray Fluorescence Analyzer and X-Ray Fluorescence Analysis Method
X-Ray Analyzer
X-Ray Analyzer and X-Ray Analysis Method
Transmission X-Ray Analyzer and Transmission X-Ray Analysis Method
Photomask Defect Correcting Method and Device
Composite Charged Particle Beam Apparatus
Composite Charged Particle Beam Apparatus
Method for Preparing Lamella
Tem Sample Preparation Method
Transmission X-Ray Analyzer
Sample Preparation Method and Apparatus
Charged Particle Beam Apparatus and Sample Transporting Apparatus
Focused Ion Beam Apparatus and Method of Adjusting Ion Beam Optics
Sample Preparation Apparatus and Sample Preparation Method
Composite Charged Particle Beam Apparatus
Sample Preparation Method
Sample Observation Method, Sample Preparation Method, and Charged Particle Beam Apparatus
Cross-Section Processing and Observation Apparatus
Ion Beam Apparatus
Cross-Section Processing and Observation Method and Cross-Section Processing and Observation Apparatus
Method for Fabricating Emitter
Charged Particle Beam Apparatus, Thin Film Forming Method, Defect Correction Method and Device Forming Method
Radiation Analyzer and Method for Analyzing Radiation
Composite Charged Particle Beam Apparatus and Thin Sample Processing Method
Crystal Analysis Apparatus, Composite Charged Particle Beam Device, and Crystal Analysis Method
Cross-Section Processing and Observation Method and Cross-Section Processing and Observation Apparatus
Charged Particle Beam Apparatus and Method for Forming Observation Image
X-Ray Fluorescence Spectrometer comprising a gas blowing mechanism
Charged Particle Beam Apparatus and Sample Processing Method Using Charged Particle Beam Apparatus
Focused Ion Beam System
X-Ray Fluorescence Spectrometer Comprising a Temperature Sensor, Two External-Air Fans, and a Circulation Fan
Focused Ion Beam System, Sample Processing Method Using the Same, and Sample Processing Program Using Focused Ion Beam
Focused Ion Beam Apparatus and Method of Working Sample Using the Same
Focused Ion Beam Apparatus, Method for Observing Cross-Section of Sample by Using the Same, and Storage Medium
Foreign Matter Detector
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Cross-Section Processing-and-Observation Method and Cross-Section Processing-and-Observation Apparatus
Cross Section Processing Method and Cross Section Processing Apparatus
Charged Particle Beam Apparatus
Thermo-Gravimetric Apparatus
X-Ray Fluorescence Analysis Apparatus
Charged Particle Beam Apparatus and Processing Method
Charged Particle Beam Apparatus and Sample Observation Method
Charged Particle Beam Device, Control Method for Charged Particle Beam Device, and Cross-Section Processing Observation Apparatus
Charged Particle Beam Apparatus Having Needle Probe That Tracks Target Position Changes
Related Assignments
(21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 2, 2011
From: TAKAHASHI, HARUO; HASUDA, MASAKATSU
To: SII NANOTECHNOLOGY INC.
Reel/Frame 026305/0542 →
Assignment of Assignor's Interest
May 2, 2011
From: TANAKA, KEIICHI; YAMAMOTO, YO; MAN, XIN; TASHIRO, JUNICHI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 026305/0580 →
Assignment of Assignor's Interest
Jun 7, 2011
From: YAMADA, KENTARO; NISHIMURA, SHINYA; FUJIWARA, HIROHITO
To: SII NANO TECHNOLOGY INC.
Reel/Frame 026450/0771 →
Assignment of Assignor's Interest
Jun 30, 2011
From: HASEGAWA, KIYOSHI; IKKU, YUTAKA; TAKIGUCHI, HIDEKI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 026532/0238 →
Assignment of Assignor's Interest
Jul 27, 2011
From: OGAWA, TAKASHI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 026695/0646 →
Assignment of Assignor's Interest
Feb 23, 2012
From: SAKAI, NORIAKI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 027753/0546 →
Assignment of Assignor's Interest
Oct 2, 2012
From: MATOBA, YOSHIKI; NAKATANI, RINTARO; SATO, TSUENO
To: SII NANOTECHNOLOGY INC.
Reel/Frame 029126/0161 →
Assignment of Assignor's Interest
Oct 2, 2012
From: MATOBA, YOSHIKI
To: SII NANOTECHNOLOGY INC.
Reel/Frame 029126/0175 →
Assignment of Assignor's Interest
Oct 3, 2012
From: TAKAOKA, OSAMU
To: SII NANOTECHNOLOGY INC.
Reel/Frame 029126/0627 →
Assignment of Assignor's Interest
Dec 5, 2012
From: UEMOTO, ATSUSHI; YAMAMOTO, YO; ASAHATA, TATSUYA
To: SII NANOTECHNOLOGY INC.
Reel/Frame 029548/0642 →
Assignment of Assignor's Interest
Dec 10, 2012
From: YAMAMOTO, YO; MAN, XIN; ASAHATA, TATSUYA
To: SII NANOTECHNOLOGY INC.
Reel/Frame 029554/0179 →
Assignment of Assignor's Interest
Feb 7, 2013
From: SUZUKI, HIDEKAZU; NAKATANI, IKUKO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 029769/0268 →
Assignment of Assignor's Interest
Feb 20, 2013
From: SUZUKI, HIDEKAZU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 029837/0341 →
Assignment of Assignor's Interest
Mar 22, 2013
From: HASUDA, MASAKATSU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 030070/0797 →
Assignment of Assignor's Interest
Mar 22, 2013
From: SUGIYAMA, YASUHIKO; ASAHATA, TATSUYA; DOI, TOSHIO; OBA, HIROSHI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 030070/0175 →
Assignment of Assignor's Interest
Aug 9, 2013
From: NAKATANI, IKUKO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 031138/0787 →
Assignment of Assignor's Interest
Aug 28, 2013
From: MATOBA, YOSHIKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 031102/0235 →
Change of Name
Apr 4, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 032612/0572 →
Change of Name
Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
Change of Name
Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →