IP Library Granted Patent US 9,400,255
Granted Patent B2
US 9,400,255 · App. 14/219,579 · Granted Jul 26, 2016

X-ray fluorescence spectrometer comprising a gas blowing mechanism

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Quick Facts
Patent No.
US 9,400,255
App. No.
14/219,579
Granted
Jul 26, 2016
Kind
B2
Abstract

An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage.

Claims (29)

1. An X-ray fluorescence spectrometer comprising:

a sample stage configured to place a sample thereon;

an X-ray source configured to irradiate the sample with primary X-rays;

a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which comprises an X-ray incident window formed by a window material through which fluorescent X-rays are transmittable; and

a gas blowing mechanism comprising a passage extending along a periphery of the detector up to the X-ray incident window and configured to blow gas through the passage to an outer surface of the X-ray incident window.

2. The X-ray fluorescence spectrometer according to claim 1 , wherein the gas blowing mechanism comprises a mechanism which also blows the gas to the sample stage.

3. The X-ray fluorescence spectrometer according to claim 1 , wherein the gas comprises helium (He).

4. The X-ray fluorescence spectrometer according to claim 1 ,

wherein the detector comprises a collimator section, which is disposed in a periphery of the X-ray incident window, and which is configured to set an opening degree of the X-ray incident window,

wherein the gas blowing mechanism comprises:

a supply source of the gas;

a gas pipe, a base end of which is connected to the supply source; and

an internal gas flow passage, which is disposed in the collimator section, and in which a tip end of the gas pipe is connected to a base end of the internal gas flow passage, wherein the internal gas flow passage comprises a plurality of blow out holes for blowing out the gas at a tip end of the internal gas flow passage, and

wherein the plurality of blow out holes are disposed in the periphery of the X-ray incident window so as to blow out the gas toward the outer surface of the X-ray incident window.

5. The X-ray fluorescence spectrometer according to claim 1 ,

wherein the detector comprises a collimator section, which is disposed in a periphery of the X-ray incident window, and which is configured to set an opening degree of the X-ray incident window, and

wherein the gas blowing mechanism comprises an internal gas flow passage, which is disposed in the collimator section, and which is branched off to:

a plurality of first holes disposed in the periphery of the X-ray incident window so as to blow out the gas toward the outer surface of the X-ray incident window; and

a plurality of second holes opened in a tip end surface of the collimator section so as to blow out the gas toward the sample stage.

6. An X-ray fluorescence spectrometer comprising:

a sample stage configured to place a sample thereon;

an X-ray source configured to irradiate the sample with primary X-rays;

a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which comprises an X-ray incident window formed by a window material through which fluorescent X-rays are transmittable; and

a gas blowing mechanism configured to blow gas to an outer surface of the X-ray incident window,

wherein the gas blowing mechanism comprises an internal gas flow passage, which is disposed around the periphery of the detector, and which is branched off to:

a plurality of first holes disposed in the periphery of the X-ray incident window so as to blow out the gas toward the outer surface of the X-ray incident window; and

a plurality of second holes opened spaced from the plurality of first holes in a direction further away from the periphery of the X-ray incident window so as to blow out the gas toward the sample stage.

7. The X-ray fluorescence spectrometer according to claim 6 , wherein the gas blowing mechanism comprises a passage extending along a periphery of the detector to the X-ray incident window.

8. The X-ray fluorescence spectrometer according to claim 6 , wherein the gas comprises helium (He).

Assignments (3)
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 19, 2014
From: NOHARA, HIROAKI; MATOBA, YOSHIKI; SAKAI, NORIAKI; TAKEUCHI, TOSHITADA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 032477/0062 →