IP Library Granted Patent US 9,080,945
Granted Patent B2
US 9,080,945 · App. 14/078,852 · Granted Jul 14, 2015

Cross-section processing and observation method and cross-section processing and observation apparatus

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,080,945
App. No.
14/078,852
Granted
Jul 14, 2015
Kind
B2
Abstract

A cross-section processing and observation method performed by a cross-section processing and observation apparatus, the method comprising: a cross-section processing step of forming a cross-section by irradiating a sample with an ion beam; a cross-section observation step of obtaining an observation image of the cross-section by irradiating the cross-section with an electron beam; and repeating the cross-section processing step and the cross-section observation step so as to obtain observation images of a plurality of cross-sections, wherein, in a case where Energy Dispersive X-ray Spectrometry (EDS) measurement of the cross-section is performed and an X-ray of a specified material is detected, an irradiation condition of the ion beam is changed so as to obtain observation images of a plurality of cross-sections of the specified material, and the cross-section processing and observation of the specified material is performed.

Claims (19)

1. A cross-section processing and observation method performed by a cross-section processing and observation apparatus, the method comprising: a cross-section processing step of forming a cross-section by irradiating a sample with an ion beam; a cross-section observation step of obtaining an observation image of the cross-section by irradiating the cross-section with an electron beam; and repeating the cross-section processing step and the cross-section observation step so as to obtain observation images of a plurality of cross-sections formed substantially parallel with each other at predetermined intervals, wherein, in a case where Energy Dispersive X-ray Spectrometry (EDS) measurement of the cross-section is performed and an X-ray of a specified material is detected, an irradiation condition of the ion beam is changed so as to obtain observation images of a plurality of cross-sections of the specified material, and the cross-section processing and observation of the specified material is performed, and wherein the changing of the irradiation condition includes changing the predetermined intervals to be smaller.

2. The cross-section processing and observation method according to claim 1 ,

wherein the changing of the irradiation condition includes changing an irradiation region of the ion beam to be smaller.

3. The cross-section processing and observation method according to claim 1 ,

wherein the changing of the irradiation condition includes changing an amount of current of the ion beam to be smaller.

4. The cross-section processing and observation method according to claim 1 ,

wherein, in a case where the irradiation condition is changed and the cross-section processing and observation of the specified material ends, the irradiation condition is changed to a previous irradiation condition before the change, and the cross-section processing and observation of the sample is performed.

5. The cross-section processing and observation method according to claim 1 , further comprising a display unit,

wherein, in a case where the X-ray of the specified material is detected, the display unit is configured to display that the X-ray of the specified material is detected.

6. A cross-section processing and observation method performed by a cross-section processing and observation apparatus, the method comprising: a cross-section processing step of forming a cross-section by irradiating a sample with an ion beam; a cross-section observation step of obtaining an observation image of the cross-section by irradiating the cross-section with an electron beam; and repeating the cross-section processing step and the cross-section observation step so as to obtain observation images of a plurality of cross-sections formed substantially parallel with each other at predetermined intervals, wherein, in a case where Energy Dispersive X-ray Spectrometry (EDS) measurement of the cross-section is performed and an X-ray of an unspecified material other than a material which is specified in advance is detected, an irradiation condition of the ion beam is changed so as to obtain observation images of the plurality of cross-sections of the unspecified material, and the cross-section processing and observation of the unspecified material is performed, and wherein the changing of the irradiation condition includes changing the predetermined intervals to be smaller.

7. The cross-section processing and observation method according to claim 6 ,

wherein the changing of the irradiation condition includes changing an irradiation region of the ion beam to be smaller.

8. The cross-section processing and observation method according to claim 6 ,

wherein the changing of the irradiation condition includes changing an amount of current of the ion beam to be smaller.

9. The cross-section processing and observation method according to claim 6 ,

wherein, in a case where the irradiation condition is changed and the cross-section processing and observation of the unspecified material ends, the irradiation condition is changed to a previous irradiation condition before the change, and the cross-section processing and observation of the sample is performed.

10. The cross-section processing and observation method according to claim 6 , further comprising a display unit,

wherein, in a case where the X-ray of the unspecified material is detected, the display unit is configured to display that the X-ray of the unspecified material is detected.

11. A cross-section processing and observation apparatus comprising: a sample stage configured to place a sample thereon; an ion beam column configured to irradiate the sample with an ion beam; an electron beam column configured to irradiate the sample with an electron beam; a secondary electron detector configured to detect a secondary electron generated from the sample; an Energy Dispersive X-ray Spectrometry (EDS) detector configured to detect an X-ray generated from the sample; and a control unit configured to change an irradiation condition of the ion beam in a case where an X-ray of a specified material is detected by the EDS detector during a cross-section processing and observation process, the cross-section processing and observation process including: a cross-section processing step of forming a cross-section by irradiating the sample with the ion beam, a cross-section observation step of obtaining an observation image of the cross-section based on the secondary electron or the X-ray generated from the cross-section by irradiating the cross-section with the electron beam; and repeating the cross-section processing step and the cross-section observation step so as to obtain observation images of the plurality of cross-sections formed substantially parallel with each other at predetermined intervals, and wherein the changing of the irradiation condition includes changing the predetermined intervals to be smaller.

Assignments (3)
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2013
From: UEMOTO, ATSUSHI; MAN, XIN; ASAHATA, TATSUYA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 031703/0123 →