IP Library Granted Patent US 9,001,966
Granted Patent B2
US 9,001,966 · App. 13/769,704 · Granted Apr 7, 2015

Transmission X-ray analyzer

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Quick Facts
Patent No.
US 9,001,966
App. No.
13/769,704
Granted
Apr 7, 2015
Kind
B2
Abstract

A transmission X-ray analyzer ( 1 ) for detecting a transmission X-ray image of a sample ( 100 ) that is continuous in a band shape includes: a TDI sensor ( 14 ); an X-ray source ( 12 ) arranged opposed to a TDI sensor; a pair of support rollers ( 31, 32 ) arranged away from the TDI sensor between the TDI sensor and the X-ray source, the pair of support rollers being configured to transport the sample to a detection position of the TDI sensor while keeping a constant interval between the TDI sensor and the sample; and a pair of outside rollers ( 51, 52 ) arranged respectively on an outer side of the pair of support rollers in a transportation direction (L). One of the pair of support rollers and one of the pair of outside rollers are arranged at different positions as to apply a tension to the sample between the pair of support rollers.

Claims (10)

1. A transmission X-ray analyzer for detecting a transmission X-ray image of a sample that is continuous in a band shape and moves in a predetermined transportation direction, the transmission X-ray analyzer comprising:

a time delay and integration (TDI) sensor comprising a plurality of two-dimensionally arranged image pickup devices for reading charge generated when an image derived from the transmission X-ray image is subjected to photoelectric conversion,

the TDI sensor comprising a plurality of stages of line sensors including the plurality of two-dimensionally arranged image pickup devices arranged in a direction perpendicular to the predetermined transportation direction, the plurality of stages of line sensors being arranged in the predetermined transportation direction,

the TDI sensor being configured to transfer charge accumulated in one line sensor to an adjacent subsequent line sensor;

an X-ray source arranged so as to be opposed to the TDI sensor;

a pair of support rollers arranged away from the TDI sensor in a detection direction connecting the TDI sensor to the X-ray source between the TDI sensor and the X-ray source,

the pair of support rollers being configured to transport the sample to a detection position of the TDI sensor while keeping a constant interval between the TDI sensor and the sample; and

a pair of outside rollers arranged respectively on an outer side of the pair of support rollers in the predetermined transportation direction,

the pair of outside rollers being configured to transport the sample, wherein one of the pair of support rollers and one of the pair of outside rollers, which are adjacent to each other, are arranged at different positions in the detection direction so as to apply a tension to the sample between the pair of support rollers.

2. A transmission X-ray analyzer according to claim 1 , wherein the pair of support rollers is fixed to the TDI sensor.

Assignments (3)
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2013
From: MATOBA, YOSHIKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 031102/0235 →