Composite charged particle beam apparatus
View Patent ↗A composite charged particle beam apparatus comprises an FIB column having an ion beam irradiation axis and an SEM column having an electron beam irradiation axis, the FIB and SEM columns being arranged relative to one another so that the beam irradition axes intersect with each other substantially at a right angle. A sample stage is provided for mounting a sample, and a detector detects secondary particles generated from the sample when irradiated with the ion beam or the electron beam. An observation image formation portion forms an FIB image and an SEM image based on a detection signal of the detector. A display portion displays the FIB image and the SEM image in which a horizontal direction of the sample in the FIB image and said horizontal direction of the sample in the SEM image are the same thereby making it possible for an operator to easily comprehend the positional relationship of the observation image of the sample.
1. A composite charged particle beam apparatus, comprising:
an FIB column having an ion beam irradiation axis;
an SEM column having an electron beam irradiation axis, the SEM column being arranged relative to the FIB column so that the beam irradiation axes thereof intersect with each other substantially at a right angle;
a sample stage for mounting a sample;
a detector for detecting secondary particles generated from the sample;
an observation image formation portion for forming an FIB image and an SEM image based on a detection signal of the detector; and
a display portion for displaying the FIB image and the SEM image such that the horizontal display direction of the sample is the same in both the FIB image and the SEM image.
2. A composite charged particle beam apparatus according to claim 1 , further comprising a scanning control portion for controlling beam scanning directions of the FIB column and the SEM column so that the horizontal display direction of the sample in the FIB image and the horizontal display direction of the sample in the SEM image become the same.
3. A composite charged particle beam apparatus according to claim 1 , further comprising an image processing portion for performing image processing on one of the FIB image and the SEM image so that the horizontal display direction of the sample in the FIB image and the horizontal display direction of the sample in the SEM image become the same.
4. A composite charged particle beam apparatus according to claim 3 , further comprising a three-dimensional image formation portion for reversing horizontal directions of a plurality of the SEM images, which are acquired by repeating observation plane formation by FIB irradiation and SEM image acquisition of the observation plane, and for forming a three-dimensional image from the reversed plurality of the SEM images.
5. A composite charged particle beam apparatus according to claim 2 , further comprising a three-dimensional image formation portion for reversing horizontal directions of a plurality of the SEM images, which are acquired by repeating observation plane formation by FIB irradiation and SEM image acquisition of the observation plane, and for forming a three-dimensional image from the reversed plurality of the SEM images.
6. A composite charged particle beam apparatus according to claim 1 , further comprising a three-dimensional image formation portion for reversing horizontal directions of a plurality of the SEM images, which are acquired by repeating observation plane formation by FIB irradiation and SEM image acquisition of the observation plane, and for forming a three-dimensional image from the reversed plurality of the SEM images.