Charged particle beam apparatus having needle probe that tracks target position changes
View Patent ↗A charged particle beam apparatus includes: a charged particle beam column; a detector configured to detect secondary charged particles; an image processor; a display device; a needle arranged in an irradiation area of charged particle beam; a needle actuator; a user interface; and a controller configured to control the needle actuator to actuate the needle in accordance with a target position that is set by the user interface. The controller controls the needle actuator to move the needle to track a change of the target position that is set by the user interface.
1. A charged particle beam apparatus comprising:
a charged particle beam column configured to irradiate an irradiation target with a charged particle beam;
a detector configured to detect secondary charged particles emitted from the irradiation target by the irradiation with the charged particle beam;
an image processor configured to produce image data indicating a two-dimensional distribution of intensity of the secondary charged particles detected by the detector;
a display device configured to display the image data produced by the image processor;
a needle arranged in an irradiation area of the charged particle beam;
a needle actuator configured to actuate the needle;
a user interface configured to receive an operation input of an operator and set a target position of the needle on the image data in accordance with the operation input; and
a controller configured to control the needle actuator to actuate the needle in accordance with the target position that is set by the user interface,
wherein the controller controls the needle actuator to move the needle to track a change of the target position that is set by the user interface.
2. The charged particle beam apparatus according to claim 1 , wherein the controller is configured to repeatedly acquire the target position at predetermined timings and to update the target position.
3. The charged particle beam apparatus according to claim 1 ,
wherein the controller is configured to control the needle actuator to set an actuating direction in accordance with an irradiation direction of the charged particle beam, and
wherein the charged particle beam comprises a focused ion beam and an electron beam the irradiation directions of which are set with a predetermined angle with respect to one another.
4. The charged particle beam apparatus according to claim 1 , wherein, in a case where a scanning direction of the charged particle beam is changed to have a predetermined angle with respect to an actuating axis of the needle actuator, the controller controls the needle actuator to set the actuating direction of the needle in accordance with the scanning direction of the charged particle beam.
5. A charged particle beam apparatus comprising:
a charged particle beam column configured to irradiate an irradiation target with a charged particle beam;
a detector configured to detect secondary charged particles emitted from the irradiation target by the irradiation with the charged particle beam;
an image processor configured to produce image data indicating a two-dimensional distribution of intensity of the secondary charged particles detected by the detector;
a display device configured to display the image data produced by the image processor;
a needle arranged in an irradiation area of the charged particle beam;
a needle actuator configured to actuate the needle;
a user interface configured to receive an operation input of an operator and set sequential target positions of the needle on the image data in accordance with the operation input; and
a controller configured to control the needle actuator to actuate the needle in accordance with the sequential target positions set by the user interface,
wherein, when an original target position is changed to a new target position on the image data before the needle reaches the original target position, the controller controls the needle actuator to track the change of the target position and move the needle toward the new target position bypassing the original target position.
6. The charged particle beam apparatus according to claim 5 ; wherein the user interface includes a cursor movable to the target positions on the image data; and wherein the controller is configured to repeatedly update the target positions at predetermined timings in accordance with the position of the cursor.
7. The charged particle beam apparatus according to claim 5 ; wherein, in a case where a scanning direction of the charged particle beam is changed to have a predetermined angle with respect to an actuating axis of the needle actuator, the controller controls the needle actuator to set the actuating direction of the needle in accordance with the scanning direction of the charged particle beam.
8. The charged particle beam apparatus according to claim 5 ; wherein the charged particle beam is an ion beam.
9. The charged particle beam apparatus according to claim 8 ; wherein the controller is configured to control the needle actuator to set an actuating direction thereof in accordance with an irradiation direction of the ion beam.
10. The charged particle beam apparatus according to claim 5 ; wherein the charged particle beam is an electron beam.
11. The charged particle beam apparatus according to claim 10 ; wherein the controller is configured to control the needle actuator to set an actuating direction thereof in accordance with an irradiation direction of the electron beam.