IP Library › Assignment 026305/0542
Patent Assignment
Reel/Frame 026305/0542

Assignment of Assignor's Interest

Recorded: 2011-05-02 Pages: 3
Assignors
TAKAHASHI, HARUO
Executed: 2011-04-07
HASUDA, MASAKATSU
Executed: 2011-04-07
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Composite charged particle beam apparatus and sample processing and observing method
Patent: 8,642,958 →
Application: 13/065,237 →
Publication: US 2011/0226947
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →