IP Library Assignment 030156/0688
Patent Assignment
Reel/Frame 030156/0688

Assignment of Assignor's Interest

Recorded: 2013-04-05 Pages: 2
Assignors
TAKAGI, YUJI
Executed: 2013-04-01
HAMAMURA, YUICHI
Executed: 2013-04-02
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method of Evaluating Systematic Defect, and Apparatus Therefor
Patent: 8,621,400 →
Application: 13/877,922 →
Publication: US 2013/0191807
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →