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Patent Assignment
Reel/Frame 030162/0960

Assignment of Assignor's Interest

Recorded: 2013-04-05 Pages: 2
Assignors
KITAYAMA, SHINYA
Executed: 2013-01-09
SUZUKI, WATARU
Executed: 2013-01-09
TOMIMATSU, SATOSHI
Executed: 2013-01-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device and Sample Observation Method Using a rotating detector
Patent: 8,791,413 →
Application: 13/817,644 →
Publication: US 2013/0146765
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →