Patent Assignment
Reel/Frame 030225/0676
Assignment of Assignor's Interest
Recorded: 2013-04-16
Pages: 5
Assignors
WANG, MILL-JER
Executed: 2013-03-12
PENG, CHING-NEN
Executed: 2013-03-12
LIN, HUNG-CHIH
Executed: 2013-03-12
LIN, WEI-HSUN
Executed: 2013-03-12
CHEN, HAO
Executed: 2013-03-12
HUANG, CHUNG-HAN
Executed: 2013-03-12
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
NO. 8, LI-HSIN ROAD 6, HSINCHU SCIENCE PARK, HSIN-CHU, 300-77, TAIWAN
Covered Property
(1)
Integrated Circuit Test System and Method