IP Library › Assignment 030358/0675
Patent Assignment
Reel/Frame 030358/0675

Assignment of Assignor's Interest

Recorded: 2013-05-06 Pages: 2
Assignors
LI, YOUSEN
Executed: 2013-05-03
LEE, STEVEN
Executed: 2013-05-06
CHEN, DAVID ZHEHAO
Executed: 2013-05-02
Assignee
ADVANCED MICRO-FABRICATION EQUIPMENT INC, SHANGHAI
188 TAIHUA ROAD, JINQIAO EXPORT PROCESSING ZONE (SOUTH AREA), PUDONG, SHANGHAI, 201201, CHINA
Covered Property (1)
Method and Device for Measuring Temperature of Substrate in Vacuum Processing Apparatus
Patent: 9,443,715 →
Application: 13/888,330 →
Publication: US 2013/0292370
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 3, 2019
From: ADVANCED MICRO-FABRICATION EQUIPMENT INC, SHANGHAI
To: ADVANCED MICRO-FABRICATION EQUIPMENT INC. CHINA
Reel/Frame 049352/0507 →