IP Library › Assignment 030491/0987
Patent Assignment
Reel/Frame 030491/0987

Assignment of Assignor's Interest

Recorded: 2013-05-28 Pages: 2
Assignors
TANIGUCHI, ATSUSHI
Executed: 2013-05-15
UENO, TAKETO
Executed: 2013-05-15
MATSUMOTO, SHUNICHI
Executed: 2013-05-17
HONDA, TOSHIFUMI
Executed: 2013-05-15
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Device and Defect Inspection Method
Patent: 9,019,492 →
Application: 13/989,835 →
Publication: US 2013/0242294
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →