IP Library › Assignment 030509/0689
Patent Assignment
Reel/Frame 030509/0689

Assignment of Assignor's Interest

Recorded: 2013-05-30 Pages: 2
Assignors
ONO, MAKOTO
Executed: 2013-04-16
CHIDA, TAKAFUMI
Executed: 2013-05-07
HIRAI, TAKEHIRO
Executed: 2013-04-19
KANEZAWA, MASAKAZU
Executed: 2013-04-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Device Therefor
Patent: 9,148,631 →
Application: 13/881,378 →
Publication: US 2013/0235182
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →