IP Library Assignment 030540/0126
Patent Assignment
Reel/Frame 030540/0126

Assignment of Assignor's Interest

Recorded: 2013-06-04 Pages: 2
Assignors
YOSHIDA, TAKAHO
Executed: 2013-05-03
AKIMA, HISANAO
Executed: 2013-05-03
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Charged Particle Optical Equipment and Method for Measuring Lens Aberration
Patent: 9,224,574 →
Application: 13/883,034 →
Publication: US 2013/0256531
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →