IP Library › Assignment 030606/0173
Patent Assignment
Reel/Frame 030606/0173

Assignment of Assignor's Interest

Recorded: 2013-06-13 Pages: 2
Assignors
OTANI, YUKO
Executed: 2013-05-31
URANO, YUTA
Executed: 2013-06-03
HONDA, TOSHIFUMI
Executed: 2013-06-03
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Observing Defects
Patent: 9,773,641 →
Application: 13/993,838 →
Publication: US 2013/0277553
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →