Patent Assignment
Reel/Frame 030658/0856
Assignment of Assignor's Interest
Recorded: 2013-06-21
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Method and Defect Inspection Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.