Patent Assignment
Reel/Frame 030725/0297
Assignment of Assignor's Interest
Recorded: 2013-07-02
Pages: 2
Assignors
YAMAGUCHI, ATSUKO
Executed: 2013-05-21
SOHDA, YASUNARI
Executed: 2013-05-23
MAEDA, TATSUYA
Executed: 2013-05-28
NASU, OSAMU
Executed: 2013-05-28
KAWADA, HIROKI
Executed: 2013-05-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Apparatus for Measuring Displacement Between Patterns and Scanning Electron Microscope Installing Unit for Measuring Displacement Between Patterns
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.