IP Library Assignment 030815/0144
Patent Assignment
Reel/Frame 030815/0144

Assignment of Assignor's Interest

Recorded: 2013-07-17 Pages: 2
Assignors
URANO, YUTA
Executed: 2013-06-18
HONDA, TOSHIFUMI
Executed: 2013-06-24
SHIBATA, YUKIHIRO
Executed: 2013-06-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Apparatus
Patent: 8,922,764 →
Application: 13/976,178 →
Publication: US 2013/0301042
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →