IP Library › Assignment 030862/0553
Patent Assignment
Reel/Frame 030862/0553

Assignment of Assignor's Interest

Recorded: 2013-07-24 Pages: 2
Assignors
DONG, SHUANGQI
Executed: 2013-05-27
SATO, NORIO
Executed: 2013-05-27
KOYAMA, SUSUMU
Executed: 2013-05-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Microscope and Measurement Image Correction Method Thereof
Patent: 8,957,959 →
Application: 13/981,326 →
Publication: US 2013/0300854
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →