Patent Assignment
Reel/Frame 030866/0571
Assignment of Assignor's Interest
Recorded: 2013-07-24
Pages: 2
Assignors
BIZEN, DAISUKE
Executed: 2013-06-13
MAKINO, HIROSHI
Executed: 2013-06-29
TANAKA, JUNICHI
Executed: 2013-06-20
EZUMI, MAKOTO
Executed: 2013-06-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Length Measuring Method Using the Same
Application:
13/993,829 →
Publication:
US 2013/0292568
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.