IP Library › Assignment 030882/0615
Patent Assignment
Reel/Frame 030882/0615

Assignment of Assignor's Interest

Recorded: 2013-07-26 Pages: 2
Assignors
URANO, YUTA
Executed: 2013-06-04
HONDA, TOSHIFUMI
Executed: 2013-07-17
JINGU, TAKAHIRO
Executed: 2013-06-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method, Low Light Detecting Method and Low Light Detector
Patent: 9,588,054 →
Application: 13/882,542 →
Publication: US 2013/0321798
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →