IP Library › Assignment 031082/0488
Patent Assignment
Reel/Frame 031082/0488

Assignment of Assignor's Interest

Recorded: 2013-08-26 Pages: 2
Assignors
SHIBATA, YUKIHIRO
Executed: 2013-08-20
NAKAO, TOSHIYUKI
Executed: 2013-08-20
URANO, YUTA
Executed: 2013-08-20
HONDA, TOSHIFUMI
Executed: 2013-08-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Device Using Same
Patent: 8,958,062 →
Application: 13/701,834 →
Publication: US 2014/0009755
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →