IP Library › Assignment 031157/0820
Patent Assignment
Reel/Frame 031157/0820

Assignment of Assignor's Interest

Recorded: 2013-08-16 Pages: 4
Assignors
TANAKA, KEIICHI
Executed: 2013-08-09
OHGAKI, MASATAKA
Executed: 2013-08-09
ODAWARA, AKIKAZU
Executed: 2013-08-09
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Radiation Analyzer and Method for Analyzing Radiation
Patent: 9,229,114 →
Application: 13/965,673 →
Publication: US 2014/0048717
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →