IP Library › Assignment 031186/0270
Patent Assignment
Reel/Frame 031186/0270

Assignment of Assignor's Interest

Recorded: 2013-09-11 Pages: 4
Assignors
IVAN, MAIDANCHUK
Executed: 2013-08-20
SO, BYUNG-SOO
Executed: 2013-08-20
LEE, DONG-HYUN
Executed: 2013-08-20
LEE, WON-PIL
Executed: 2013-08-20
Assignee
SAMSUNG DISPLAY CO., LTD
95, SAMSUNG 2 RO, GIHEUNG-GU, YONGIN-CITY, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Method and System for Monitoring Crystallization of Amorphous Silicon Thin Film, and Method of Manufacturing Thin Film Transistor by Using the Method and System
Patent: 9,257,288 →
Application: 14/022,126 →
Publication: US 2014/0329343