Patent Assignment
Reel/Frame 031429/0259
Assignment of Assignor's Interest
Recorded: 2013-10-17
Pages: 6
Assignors
SEOL, CHANG-KYU
Executed: 2013-07-23
KONG, JUN-JIN
Executed: 2013-07-23
SON, HONG-RAK
Executed: 2013-07-23
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Determining Deterioration State of Memory Device and Memory System Using the Same